Interface Technology, Inc

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VXI digital test subsystem consisting of two dual-slot C-size VXIbus modules, an SR2510 main module and an SR2520 expansion module


  • Supports both parallel and serial testing of all standard TTL, differential ECL, variable voltage, or 5V CMOS logic devices, assemblies, units, or systems that require up to 576 individual input and output channels
  • Self-contained stimulus/response/real-time compare/record digital test module providing up to 96 bidirectional input/output channels
  • Each module provides 32-96 additional bidirectional I/O channels, up to a maximum of 576 channels per VXI mainframe

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